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  • ½ºÅÙ½Ç ÇÁ¸°Æ®¹ýÀ¸·Î ÀμâÇÑ Sn-1.8Bi-0.7Cu-0.6In ¼Ö´õÀÇ °í¿Â ½ÃÈ¿ Ư¼º; ÀÌÀç½Ä, Á¶¼±¿¬, ÀÌ¿µ¿ì, ±è±Ô¼®, ÀüÁÖ¼±, Á¤ÀçÇÊ;Journal of Microelectronics & Packaging Society, Vol. 12, No. 4, p.301-306, 2005
  • Reliability of Sn-8 mass% Zn-3 mass % Bi Lead - free Solder and Zn Behavior, Sun-Yun Cho, Young-Woo Lee,Kyoo-Seok Kim, Young-Jun Moon, Ji-Won Lee, Hyun-Joo Han, Mi-Jin Kim and Jae-Pil Jung, Materials Transactions,Vol. 46. No. 11 (2005) pp. 2322 to 2328
  • Flip Chip Bump Formation of Sn-1.8 Bi-0.8 Cu-0.6 In Solder by Stencil Printing, Jaesik Lee, Jae-Pil Jung, Chu-Seon Cheon, Yunhong Zhou and Michael Mayer, Material Transactions, Vol. 46, No. 11 (2005) pp. 2359 to 2365
  • Sn8Zn3Bi ¼Ö´õ¸¦ ÀÌ¿ëÇÑ 1608 Ĩ ¼Ö´õ¸µºÎÀÇ ¿­Ãæ°Ý ½Å·Ú¼º Æò°¡, ÀÌ¿µ¿ì, ±è±Ô¼®, È«¼ºÁØ, Á¤ÀçÇÊ, ¹®¿µÁØ, ÀÌÁö¿ø, ÇÑÇöÁÖ, ±è¹ÌÁø, ´ëÇÑ¿ëÁ¢ÇÐȸ Ãß°è Çмú¹ßÇ¥´ëȸ, 2005³â 11¿ù
  • Sn8Zn3Bi ¼Ö´õ¸¦ ÀÌ¿ëÇÑ 1608 Ĩ ¼Ö´õ¸µºÎÀÇ °í¿Â°í½À ½Å·Ú¼º Æò°¡, ±è±Ô¼®, ÀÌ¿µ¿ì, È«¼ºÁØ, Á¤ÀçÇÊ, ¹®¿µÁØ, ÀÌÁö¿ø, ÇÑÇöÁÖ, ±è¹ÌÁø, ´ëÇÑ¿ëÁ¢ÇÐȸ Ãß°è Çмú¹ßÇ¥´ëȸ, 2005³â 11¿ù
  • The Correlation between Stress Relacation and Steady-State Creep of Eutectic Sn-Pb, W.H. BANG, K.H. OH, J.P. Jung, J.W. MORRIS, Jr., and FAY. HUA, Journal of ELECTRONICS MATERIALS, Vol. 34, No. 10, 2005, pp. 1287-1300
  • Sn-3.5Ag ¼Ö´õ¸¦ ÀÌ¿ëÇÑ Si-¿þÀÌÆÛÀÇ ÃÊÀ½ÆÄ Á¢ÇÕºÎÀÇ Àü´Ü°­µµ, ±è±Ô¼®, È«¼ºÁØ, ÀÌ¿µ¿ì, Á¶¼±¿¬, ±èÁ¤¸ð, Á¤ÀçÇÊ, ´ëÇѱݼÓÀç·áÇÐȸ Ãß°èÇмú´ëȸ, 2005³â 10¿ù
  • Sn-8Zn-3Bi ¼Ö´õ¸¦ ÀÌ¿ëÇÑ 1608ħÀÇ °­µµ Æò°¡, ÀÌ¿µ¿ì, ±è±Ô¼®, Á¶¼±¿¬, Á¤ÀçÇÊ, ¹®¿µÁØ, ÀÌÁö¿ø, ÇÑÇöÁÖ, ±è¹ÌÁø, ´ëÇѱݼÓÀç·áÇÐȸ Ãß°èÇмú´ëȸ, 2005³â 10¿ù
  • Si-Wafer ¿Í FR-4 ±âÆÇÀÇ ÃÊÀ½ÆÄ Á¢ÇÕºÎÀÇ ¹Ì¼¼Á¶Á÷ °üÂû, È«¼ºÁØ, ±è±Ô¼®, ±èÁ¤¸ð, ÀÌ¿µ¿ì, Á¤ÀçÇÊ, Á¶¼±¿¬, ´ëÇѱݼÓÀç·áÇÐȸ Ãß°èÇмú´ëȸ, 2005³â 10¿ù
  • Bonding Mechanism of Ultrasonic Gold Ball Bonds on Copper Substrate at Ambient Temperature, L. Lum, S. Y. Cho, Y, Zhou, J. P. Jung, ´ëÇÑ ±Ý¼ÓÀç·áÇÐȸ Ãß°èÇмú´ëȸ, 2005³â 10¿ù
  • Experimental Study of Ultrasonic Wedge Bonding with Copper Wire, 2005 6th International Conference on Electronics Packaging Technology(Shenzhen, China Aug 31 ~ Sep 2, 2005), IEEE & China Electronics Packaging Society, Y.H. Tian,  I. Lum, S. J. Won, S. H. Park, J. P. Jung, M. Mayer, Y. Zhou,  " Philips  Best  Paper  Award " ¼ö»ó
  • Sn-8 wt%Zn-3 wt%Bi ¹«¿¬¼Ö´õÀÇ ½Å·Ú¼º°ú Zn»óÀÇ Çüź¯È­, Á¶¼±¿¬, ÀÌ¿µ¿ì, ±è±Ô¼®, Á¤ÀçÇÊ, ¹®¿µÁØ, ÀÌÁö¿ø, ÇÑÇöÁÖ, ±è¹ÌÁø, ±Ý¼ÓÀç·áÇÐȸÁö Á¦ 43 ±Ç Á¦ 9È£, 2005³â 9¿ù
  • Sn-Bi µµ±Ý Sn-3.5%Ag ¼Ö´õ¸¦ ÀÌ¿ëÇÑ CapacitorÀÇ Àú¿Â¼Ö´õ¸µ, ±è¹ÌÁø, Á¶¼±¿¬, ±è¼÷ȯ, Á¤ÀçÇÊ, ´ëÇÑ¿ëÁ¢ÇÐȸÁö Á¦ 23±Ç Á¦ 3È£, 2005³â 6¿ù
  • Lower Temperature Soldering of Sn-3.5%Ag solder by Sn-Bi Coating, M. J. Kim, J. Lee, N. JHOU, J. P. Jung, S. H. Kim, International Conference on Lead-free Soldering, May 24~26, 2005, Toronto, Ontario, Canada
  • Bonding Mechanism in Ultrasonic Gold Ball Bonds on Copper Substrate, I. Lum, J.P. Jung, and Y. Zhou, Metallurgical and Materials Transactions Volume 36A (2005), No. 5, pp. 1279-1286
  • ÆÐŰ¡ ±â¼ú°ú 3Â÷¿ø ½ÇÀå. ±èÁ¤¸ð, Á¤ÀçÇÊ, ±è¼÷ȯ, ¹ÚÀçÇö. ´ëÇÑ¿ëÁ¢ÇÐȸÁö, Á¦23±Ç Á¦ 2È£, 2005³â 4¿ù, PP.129~138
  • Sn-8mass%Zn-3mass%Bi ¹«¿¬ ¼Ö´õÀÇ ½Å·Ú¼º°ú ZnÀÇ °Åµ¿, Á¶¼±¿¬, ÀÌ¿µ¿ì, ±è±Ô¼®, Á¤ÀçÇÊ, ¹®¿µÁØ, ÀÌÁö¿ø, ÇÑÇöÁÖ, ±è¹ÌÁø, ´ëÇÑ¿ëÁ¢ÇÐȸ Ãá°è Çмú¹ßÇ¥ ´ëȸ, 2005³â 6¿ù
  • Characteristic of copper wire wedge bonding, Á¤ÀçÇÊ, Á¶¼±¿¬, Y.Tian, Y. Zhou, M. Mayer, ¿ø¼ºÁØ, À̼ºÁØ, ´ëÇÑ¿ëÁ¢ÇÐȸ Ãá°èÇмú ¹ßÇ¥´ëȸ, 2005³â 6¿ù
  • Sn-3.5Ag ¹«¿¬ ¼Ö´õ¸¦ ÀÌ¿ëÇÑ Si-wafer¿Í FR-4 ±âÆÇÀÇ »ó¿ÂÁ¢ÇÕ, ±èÁ¤¸ð, Á¶¼±¿¬, ±è±Ô¼®, ÀÌ¿µ¿ì, Á¤ÀçÇÊ, ´ëÇÑ¿ëÁ¢ÇÐȸ Ãá°èÇмú ¹ßÇ¥´ëȸ, 2005³â 6¿ù
  • Fluxless Plasma Bumping of Lead-free Solders  and the Reliability effects of Under Bump Metallization Thickness, Joon Kwon Moon, Y. Zhou and  Jae Pil Jung, Soldering and Surface Mount Technology, Vol 17(2005), No 2, " Highly Commended Award " ¼ö»ó
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